Objectively Measuring the Reliability of IoT Devices

In the realm of IoT devices, the metric that reigns supreme is device reliability. When managing thousands or even millions of devices, tracking this metric becomes paramount.

While Mean Time Between Failure (MTBF) has been a historical stalwart for assessing product stability, its utility diminishes when dealing with extensive device fleets and complex operating patterns.

Join us in this talk as we introduce a groundbreaking metric for evaluating the reliability of expansive device fleets: Failure Free Hours. Discover how this metric unveils the frequency of firmware faults, unexpected device reboots, and core function failures. Through a systematic approach to calculate this metric device operators and engineers gain the power to actively monitor and enhance IoT fleet reliability, thereby ensuring seamless operations and exceptional user experiences.

Memfault is the first IoT reliability platform that empowers teams to build robust devices with software at scale. Memfault applies device reliability engineering (DRE) techniques to transform the way developers build and operate IoT and edge devices. As IoT applications continue to grow in complexity, it is more important than ever for developers to integrate Memfault’s performance monitoring, debugging, and OTA update capabilities into their devices. Memfault was built to enable developers with a more scalable and sustainable process to accelerate go-to-market, de-risk product launches, cut product costs, and deliver overall superior products. The company was founded by engineers with decades of experience from Fitbit, Oculus, and Pebble. Memfault is backed by Uncork Capital, Partech, S28 Capital, and Y Combinator.