Accelerating System-Level Embedded Testing with OpenHTF and AI

In many embedded development workflows, system-level and black-box testing are naturally positioned later in the lifecycle, once firmware functionality and system behavior have stabilized. While effective for validation, this timing can limit early feedback on real device behavior.

This talk presents a practical approach to accelerating system-level testing by combining OpenHTF with AI-assisted development. By leveraging AI to bootstrap test frameworks and focusing firmware engineers on test design rather than infrastructure, teams can bring automated device-under-test validation online much earlier in the development cycle.

Through real embedded firmware experience, we demonstrate how early system-level automation complements unit and integration tests, enabling faster iteration, improved reliability, and smoother collaboration between firmware and QA teams.